| 000 | 00816nam^a2200241zi^4500 | ||
|---|---|---|---|
| 008 | 980813c^^^^1991xxu^^^^^^^^^^^000^0^eng^d | ||
| 020 | _a0-8247-8556-8 (papel libre de acido) | ||
| 035 | _aMX001000761176 | ||
| 041 | _aSPA | ||
| 050 | 4 |
_aQH212.E4 _bM87 1991 |
|
| 100 | 1 |
_aMurr, Lawrence Eugene, _eautor |
|
| 245 | 1 | 0 |
_aElectron and ion microscopy and microanalysis : _bprinciples and applications / _cLawrence E. Murr |
| 250 |
_a2nd ed., _brev. and expanded |
||
| 264 | 1 |
_aNew York : _bM. Dekker, _cc1991 |
|
| 300 | _a837 páginas | ||
| 336 |
_atexto _2rdacontent |
||
| 337 |
_asin medio _2rdamedia |
||
| 338 |
_avolumen _2rdacarrier |
||
| 490 | 0 |
_aOptical engineering ; _v29 |
|
| 650 | 4 | _aMicroscopía electrónica | |
| 650 | 4 | _aMicroscopía iónica de campo | |
| 650 | 4 | _aAnálisis por microsonda | |